Generic Processes & Materials - Workplan 2019

Version 1.1

 

• Geometry Biasing with Importance:
• Comparison between generic and importance biasing
• Investigate rare crashes in Geometry-based Importance biasing
• Implement extension for multiple particle-type biasing. 
• Differential Cross-section class:
• Design and implementation of at least an elastic diff. cross-section class to be used in DXTRAN option
• Make use of this class in some processes
  • In particular the hadron elastic one
• Generic Biasing:
• Continue enriching event biasing options:
  • Leading particle (alternative to existing one in HAD)
  • DXTRAN-like biasing
  • Implicit capture
    • Clarify MCNP scheme for implicit capture
• Extend generic biasing scheme for at rest case
• Statistical test suite to verify correctness of biasing wrt to analog
• Feasibility studies and prototyping
  • Biasing of charged particles, with cross-section changing over the step
  • Use of occurrence biasing to allow continuous density change inside a same volume
  • Material/isotope biasing
  • Woodcock tracking
• Large cross-section change (eg : neutrino interaction)
  • Investigate potential difficulties in propagating tiny weights.
• Fast Simulation:
• Continuation of GFlash models revision
• Radiotherapy & radioprotection:
• Completion of the ambient dose equivalent H*(10) topics